IEC 60444-2:1980

January 1980

International standard Current

Measurement of quartz crystal unit parameters by zero phase technique in A ii-network. Part 2 : phase offset method for measurement of motional capacitance of quartz crystal units.

Main informations

International IEC standards

January 1980

18 p.

IEC 60444-2:1980

31.140 Piezoelectric devices

1 - 13/06/2005

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