IEC 60749-22:2002

IEC 60749-22:2002

September 2002
International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 22 : bond strength

Main informations

Collections

International IEC standards

Publication date

September 2002

Number of pages

41 p.

Reference

IEC 60749-22:2002

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1 - 13/06/2005
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