NF ISO 15529

NF ISO 15529

April 2011
Standard Current

Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

ISO 15529:2010 specifies the principal MTFs associated with a sampled imaging system, together with related terms, and outlines a number of suitable techniques for measuring these MTFs. It also defines a measure for the “aliasing” related to imaging with such systems. ISO 15529:2010 is particularly relevant to electronic imaging devices such as digital still and video cameras and the detector arrays they embody.

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Main informations

Collections

National standards and national normative documents

Publication date

April 2011

Number of pages

32 p.

Reference

NF ISO 15529

ICS Codes

17.180.01   Optics and optical measurements in general

Classification index

S10-050

Print number

1 - 16/03/2011

International kinship

ISO 15529:2010
Sumary
Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

ISO 15529:2010 specifies the principal MTFs associated with a sampled imaging system, together with related terms, and outlines a number of suitable techniques for measuring these MTFs. It also defines a measure for the “aliasing” related to imaging with such systems.

ISO 15529:2010 is particularly relevant to electronic imaging devices such as digital still and video cameras and the detector arrays they embody.

Replaced standards (1)
NF ISO 15529
November 2007
Standard Cancelled
Optics and photonics - Optical transfer function - Principles of measurement of modulation transfer function (MTF) of sampled imaging systems

Dans la série de normes relatives à la fonction de transfert optique, le présent document concerne la mesure de cette fonction pour des systèmes à image échantillonnée.

Table of contents
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  • Avant-propos
    iv
  • 1 Domaine d'application
    1
  • 1 Références normatives
    1
  • 3 Termes, définitions et symboles
    2
  • 3.1 Termes et définitions
    2
  • 3.2 Symboles
    4
  • 4 Relations théoriques
    5
  • 4.1 Transformée de Fourier de l'image de la fente objet (statique)
    5
  • 4.2 Transformée de Fourier de la sortie d'une ouverture d'échantillonnage simple impliquant une fente objet explorée à travers l'ouverture
    7
  • 4.3 Transformée de Fourier de la LSF moyenne impliquant différentes positions de la fente objet
    7
  • 5 Méthodes de mesure des MTF associées aux systèmes de formation d'image
    8
  • 5.1 Généralités
    8
  • 5.2 Azimut d'essai
    9
  • 5.3 Mesurage de la MTF du système, Tsys(r), d'un dispositif de formation d'image échantillonné ou d'un système complet
    10
  • 5.4 Mesurage de la MTF de l'ouverture d'échantillonnage, Tap
    16
  • 6 Méthode de mesure de la fonction de repliement du spectre, du rapport de repliement du spectre et du potentiel de repliement du spectre
    17
  • Annexe A (informative) Théorie fondamentale
    18
  • Annexe B (informative) Repliement du spectre dans les systèmes de formation d'image échantillonnés
    21
  • Bibliographie
    26
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