NF ISO 22309
Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS) for elements with an atomic number of 11 (Na) or above
ISO 22309:2011 gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope or an electron probe microanalyser; any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in ISO 22309. ISO 22309 provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1 %, utilizing either reference materials or "standardless" procedures. It can be used with confidence for elements with atomic number Z > 10. Guidance on the analysis of light elements with Z < 11 is also given.
ISO 22309:2011 gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope or an electron probe microanalyser; any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in ISO 22309. ISO 22309 provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1 %, utilizing either reference materials or "standardless" procedures. It can be used with confidence for elements with atomic number Z > 10.
Guidance on the analysis of light elements with Z < 11 is also given.
<p>ISO 22309:2006 gives guidance on the quantitative analysis at specific points or areas of a specimen using energy-dispersive spectrometry (EDS) fitted to a scanning electron microscope (SEM) or electron probe microanalyser (EPMA); any expression of amount, i.e. in terms of percent (mass fraction), as large/small or major/minor amounts is deemed to be quantitative. The correct identification of all elements present in the specimen is a necessary part of quantitative analysis and is therefore considered in ISO 22309:2006. ISO 22309:2006 provides guidance on the various approaches and is applicable to routine quantitative analysis of mass fractions down to 1 %, utilising either reference materials or standardless procedures. It can be used with confidence for elements with atomic number Z greater than 10.</p> <p>Guidance on the analysis of light elements with Z less than 11 is also given.</p>
- Avant-proposiv
- Introductionv
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1 Domaine d'application1
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2 Références normatives1
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3 Termes et définitions2
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4 Préparation de l'échantillon5
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5 Précautions préliminaires7
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6 Méthode d'analyse8
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7 Traitement des données9
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7.1 Généralités9
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7.2 Identification des pics9
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7.3 Estimation de l'intensité de pic10
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7.4 Calcul des rapports k10
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7.5 Effets de matrice10
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7.6 Utilisation de matériaux de référence11
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7.7 Analyse sans témoin11
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7.8 Incertitude des résultats12
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7.9 Rapport des résultats13
- Annexe A (informative) L'attribution des pics à leurs éléments14
- Annexe B (informative) Identité des pics/interférences16
- Annexe C (informative) Facteurs influençant l'incertitude d'un résultat18
- Annexe D (informative) Analyse des éléments de numéro atomique < 1120
- Annexe E (informative) Exemple de données d'une étude de reproductibilité intralaboratoire et interlaboratoires22
- Bibliographie24
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