IEC 62396-5:2014
Collections
Normes internationales IEC
Date de publication
août 2014
Nombre de pages
21 p.
Référence
IEC 62396-5:2014
Numéro de tirage
1
IEC 62396-5:2014
août 2014
Norme internationale
En vigueur
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
Informations générales
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Résumé
Process management for avionics - Atmospheric radiation effects - Part 5: Assessment of thermal neutron fluxes and single event effects in avionics systems
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:
- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and
- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
IEC 62396-5:2014(E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. IEC 62396-5 addresses two main items:
- a detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners, and
- an enhanced compilation of the thermal neutron SEU cross-section in currently available SRAM devices (more than 20 different devices). The net result of the reviews of these two different sets of data will be two ratios that are considered to be very important for leading to the ultimate objective of determining how large a threat is. This new edition includes the following technical changes with respect to the previous technical specification: document upgraded to an IEC international standard, change to title, updated references and bibliography, consideration of smaller geometries, addition of recent data on neutron cross-sections, etc.
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Normes remplacées
(1)
IEC TS 62396-5:2008
août 2008
Spécification technique
Annulée
Process management for avionics - Atmospheric radiation effects - Part 5: Guidelines for assessing thermal neutron fluxes and effects in avionics systems
IEC TS 62396-5:2008 (E) provides a more precise definition of the threat that thermal neutrons pose to avionics as a second mechanism for inducing single event upset (SEU) in microelectronics. Addresses more in detail the following: detailed evaluation of the existing literature on measurements of the thermal flux inside of airliners; an enhanced compilation of the thermal neutron SEU cross section in currently available SRAM devices (more than 20 different devices).
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