BS EN 62374:2008

BS EN 62374:2008

October 2008
Standard Current

Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Main informations

Collections

BSI English standards

Publication date

October 2008

Number of pages

24 p.

Reference

BS EN 62374:2008

ICS Codes

31.080.01   Semiconductor devices in general
31.080.99   Other semiconductor devices

Print number

1

International kinship

IEC 62374:2007

European kinship

EN 62374:2007
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