BS EN IEC 60749-17:2019

BS EN IEC 60749-17:2019

May 2019
Standard Current

Semiconductor devices. Mechanical and climatic test methods - Neutron irradiation

Main informations

Collections

BSI English standards

Publication date

May 2019

Number of pages

14 p.

Reference

BS EN IEC 60749-17:2019

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1

International kinship

IEC 60749-17 ED.2.0

European kinship

EN 60749-17 ED.2.0
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