DIN EN 60749-14

July 2004

Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 14: Robustness of terminations (lead integrity) (IEC 60749-14:2003) - German version EN 60749-14:2003 / Note: Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2006-10-01.

Main informations

DIN german standards

July 2004

19 p.

DIN EN 60749-14

31.080.01 Semiconductor devices in general

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