IEC 60749-30:2020

IEC 60749-30:2020

August 2020
International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Main informations

Collections

International IEC standards

Publication date

August 2020

Number of pages

26 p.

Reference

IEC 60749-30:2020

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1
Replaced standards (2)
IEC 60749-30:2005
January 2005
International standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 30 : preconditioning of non-hermetic surface mount devices prior to reliability testing

IEC 60749-30/A1:2011
May 2011
International standard Cancelled
Amendment 1 to publication IEC 60749-30:2005

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