This part of IEC 61280 is to describe a test procedure to measure the eye pattern and waveform parameters such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask. This edition includes the following significant technical changes with respect to the previous edition:- the necessity of DC coupling for extinction ratio measurement is clarified;- the definition of extinction ratio has been revised to better harmonize with ITU-T; and- the definition of OMA has been clarified.
Describes a test procedure to measure eye pattern and waveform parameters, such as rise time, fall time, overshoot, and extinction ratio. Alternatively, the waveform may be tested for compliance with a predetermined waveform mask.
IEC 61280-2-2:2012 describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision .This edition includes the following significant technical changes with respect to the previous edition: additional definitions; clarification of test procedures. Keywords: optical eye pattern, waveform, modulation amplitude, extinction ratio The contents of the corrigendum of February 2015 have been included in this copy.
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