NF EN 60749/A1

NF EN 60749/A1

February 2002
Standard Cancelled

Semiconductor devices - Mechanical and climatic test methods

Le présent document donne la liste des méthodes d'essais applicables aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés), parmi lesquelles on peut effectuer un choix.

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Main informations

Collections

National standards and national normative documents

Publication date

February 2002

Number of pages

13 p.

Reference

NF EN 60749/A1

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022/A1

Print number

1 - 25/02/2002

International kinship

IEC 60749/A1:2000

European kinship

EN 60749/A1:2000
Sumary
Semiconductor devices - Mechanical and climatic test methods

Le présent document donne la liste des méthodes d'essais applicables aux dispositifs à semiconducteurs (dispositifs discrets et circuits intégrés), parmi lesquelles on peut effectuer un choix.
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