NF EN 60749-32/A1

NF EN 60749-32/A1

May 2011
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)

Le présent amendement modifie les articles 2 et 3 de la NF EN 60749-32 de 2003.

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Main informations

Collections

National standards and national normative documents

Publication date

May 2011

Number of pages

9 p.

Reference

NF EN 60749-32/A1

ICS Codes

31.080.01   Semiconductor devices in general

Classification index

C96-022-32/A1

Print number

1

International kinship

IEC 60749-32/A1:2010

European kinship

EN 60749-32/A1:2010
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 32 : flammability of plastic-encapsulated devices (externally induced)

Le présent amendement modifie les articles 2 et 3 de la NF EN 60749-32 de 2003.
Table of contents
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  • Avant-propos
  • 2 Références normatives
  • 3 Procédure d'essai
  • Annexe
  • Annexe ZA (normative) Références normatives à d'autres publications internationales avec les publications européennes correspondantes
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