IEC 62396-2:2012

septembre 2012

Norme internationale Annulée

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2:- additional information on heavy ion data, neutron and proton data and thermal neutron data;- updates with regard to neutron sources: additional radiation simulators;- addition of the Anita spallation neutron source;- additional information on whole system and equipment testing;- comparison between accelerator based neutron sources.

Informations générales

Collections

Normes internationales IEC

Date de publication

septembre 2012

Nombre de pages

38 p.

Référence

IEC 62396-2:2012

Codes ICS

49.060 Équipements et systèmes électriques aérospatiaux

31.020 Composants électroniques en général

03.100.50 Production. Gestion de production

Numéro de tirage

1 - 05/10/2012

Résumé

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2:
- additional information on heavy ion data, neutron and proton data and thermal neutron data;
- updates with regard to neutron sources: additional radiation simulators;
- addition of the Anita spallation neutron source;
- additional information on whole system and equipment testing;
- comparison between accelerator based neutron sources.

Normes remplacées (1)

IEC TS 62396-2:2008

août 2008

Spécification technique Annulée

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Norme remplacée par (1)

IEC 62396-2:2017

décembre 2017

Norme internationale En vigueur

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.

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