IEC TS 62396-2:2008

IEC TS 62396-2:2008

août 2008
Spécification technique Annulée

Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Informations générales

Collections

Normes internationales IEC

Date de publication

août 2008

Nombre de pages

27 p.

Référence

IEC TS 62396-2:2008

Numéro de tirage

1 - 01/10/2008
Résumé
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC TS 62396-2:2008 (E) provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.
Normes remplacées (1)
IEC PAS 62396-2:2007
septembre 2007
Spécification publiquement disponible Annulée
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

Provides guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by the atmospheric neutrons. Also shows how the test data can be used to estimate the SEE rate of devices and boards due to the atmospheric neutrons in the atmosphere at aircraft altitudes.

Norme remplacée par (2)
IEC 62396-2:2017
décembre 2017
Norme internationale En vigueur
(pas de titre français)

IEC 62396-2:2012
septembre 2012
Norme internationale Annulée
Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

IEC 62396-2:2012 aims to provide guidance related to the testing of microelectronic devices for purposes of measuring their susceptibility to single event effects (SEE) induced by atmospheric neutrons. Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of devices and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process may be applied by other industrial sectors. This first edition includes the following significant technical changes with respect to the technical specification IEC/TS 62396-2: - additional information on heavy ion data, neutron and proton data and thermal neutron data; - updates with regard to neutron sources: additional radiation simulators; - addition of the Anita spallation neutron source; - additional information on whole system and equipment testing; - comparison between accelerator based neutron sources.

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