BS EN 62374-1:2011

BS EN 62374-1:2011

June 2011
Standard Current

Semiconductor devices - Time-dependent dielectric breakdown (TDDB) test for inter-metal layers

Main informations

Collections

BSI English standards

Publication date

June 2011

Number of pages

20 p.

Reference

BS EN 62374-1:2011

ICS Codes

31.080.01   Semiconductor devices in general
29.140.20   Incandescent lamps
43.040.20   Lighting, signalling and warning devices

Print number

1

International kinship

IEC 60809:2014/A1:2017

European kinship

EN 62374-1:2010/AC:2011
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