BS ISO 14701:2018

BS ISO 14701:2018

November 2018
Standard Current

Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

Main informations

Collections

BSI English standards

Publication date

November 2018

Number of pages

26 p.

Reference

BS ISO 14701:2018

ICS Codes

71.040.40   Chemical analysis

Print number

1

International kinship

ISO 14701:2018
Replaced standards (1)
BS ISO 14701:2011
August 2011
Standard Cancelled
Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness

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