IEC 60749-8:2002/COR2:2003

IEC 60749-8:2002/COR2:2003

August 2003
International standard Current

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Modification of the validity date: now put at 2007.

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Main informations

Collections

International IEC standards

Publication date

August 2003

Number of pages

0 p.

Reference

IEC 60749-8:2002/COR2:2003

Print number

1 - 13/06/2005
Sumary
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

Modification of the validity date: now put at 2007.
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