IEC 62047-13:2012

IEC 62047-13:2012

February 2012
International standard Current

Semiconductor devices - Micro-electromechanical devices - Part 13 : ben - and shear - type test methods of measuring adhesive strength for MEMS structures

Main informations

Collections

International IEC standards

Publication date

February 2012

Number of pages

30 p.

Reference

IEC 62047-13:2012

ICS Codes

31.080.99   Other semiconductor devices

Print number

1 - 09/03/2012
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