IEC 62878-1-1:2015

IEC 62878-1-1:2015

May 2015
International standard Current

Device embedded substrate - Part 1-1: Generic specification - Test methods

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

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Main informations

Collections

International IEC standards

Publication date

May 2015

Number of pages

109 p.

Reference

IEC 62878-1-1:2015
Sumary
Device embedded substrate - Part 1-1: Generic specification - Test methods

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.
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