JIS C 5003

July 1974

Standard Current

General test procedure of failure rate for electronic components / Note: Approved 2019-10-21 JIS, 2014-10-20 JIS, 2009-10-01 JIS, 2004-03-20 JIS, 1993-02-01 JIS, 1988-01-01 JIS, 1982-11-01 JIS, 1977-07-01 JIS

Main informations

JIS japanese standards

July 1974

13 p.

JIS C 5003

31.020 Electronic components in general

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