NF ISO 17470

August 2006

Standard Cancelled

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

ISO 17470:2004 gives guidance for the identification of elements and the investigation of the presence of specific elements, within a specific volume, contained in a specimen, by analysing X-ray spectra obtained using wavelength dispersive X-ray spectrometers on an electron probe microanalyser or on a scanning electron microscope.

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Main informations

Collections

National standards and national normative documents

Publication date

August 2006

Number of pages

17 p.

Reference

NF ISO 17470

ICS Codes

71.040.50 Physicochemical methods of analysis

Classification index

X21-003

Print number

1 - 10/07/2006

International kinship

ISO 17470:2004

Sumary

Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry

Table of contents

Avant-propos
iv
Introduction
v
1 Domaine d'application
1
2 Références normatives
1
3 Termes et définitions
1
4 Termes abrégés
2
5 Appareillage
2
6 Procédure d'identification
2
6.1 Généralités
2
6.2 Définition des conditions d'analyse
3
6.3 Méthode d'analyse d'un spectre de rayons X
4
6.4 Limite de détection
5
7 Rapport d'essai
6
Annexe A (informative) Exemple de procès-verbal d'analyse qualitative par microsonde de Castaing
8
Bibliographie
11

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