DIN EN 60749-23

July 2011

Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004 + A1:2011) - German version EN 60749-23:2004 + A1:2011 / Note: DIN EN 60749-23 (2004-10) remains valid alongside this standard until 2014-03-03.

Main informations

Collections

DIN german standards

Publication date

July 2011

Number of pages

11 p.

Reference

DIN EN 60749-23

ICS Codes

31.080.01 Semiconductor devices in general

Print number

Replaced standards (1)

DIN EN 60749-23

October 2004

Standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life (IEC 60749-23:2004) - German version EN 60749-23:2004

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