DIN EN 62374-1

DIN EN 62374-1

June 2011
Standard Current

Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010) - German version EN 62374-1:2010 + AC:2011

Main informations

Collections

DIN german standards

Publication date

June 2011

Number of pages

18 p.

Reference

DIN EN 62374-1

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1
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