DIN EN IEC 60749-13

DIN EN IEC 60749-13

October 2018
Standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2018) - German version EN IEC 60749-13:2018 / Note: DIN EN 60749-13 (2003-04) remains valid alongside this standard until 2021-03-22.

Main informations

Collections

DIN german standards

Publication date

October 2018

Number of pages

15 p.

Reference

DIN EN IEC 60749-13

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1
Replaced standards (1)
DIN EN 60749-13
April 2003
Standard Cancelled
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere (IEC 60749-13:2002) - German version EN 60749-13:2002 / Note: Under certain conditions, DIN EN 60749 (2002-09) remains valid alongside this standard until 2005-07-01.*A transition period, as set out in DIN EN IEC 60749-13 (2018-10), exists until 2021-03-22.

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