FD ISO/TR 16610-32
FD ISO/TR 16610-32

FD ISO/TR 16610-32

November 2023
Published document Current

Geometrical product specifications (GPS) - Filtration - Part 32 : robust profile filters: Spline filters

This document provides information on a generalized version of the linear spline filter for uniform and non-uniform sampling and the robust spline filters for surface profiles. It supplements ISO 16610-22, ISO 16610-30 and ISO 16610-31.This document provides information on how to apply the robust estimation to the spline filter as specified in ISO 16610-22, as well as its generalized form for non-uniform sampling. The weight function chosen for the M-estimator is the Tukey biweight influence function as specified in ISO 16610-31.

Main informations

Collections

National standards and national normative documents

Publication date

November 2023

Number of pages

24 p.

Reference

FD ISO/TR 16610-32

ICS Codes

17.040.20   Properties of surfaces
17.040.40   Geometrical Product Specification (GPS)

Classification index

E05-040-32

Print number

1

International kinship

ISO/TR 16610-32:2023
Sumary
Geometrical product specifications (GPS) - Filtration - Part 32 : robust profile filters: Spline filters

This document provides information on a generalized version of the linear spline filter for uniform and non-uniform sampling and the robust spline filters for surface profiles. It supplements ISO 16610-22, ISO 16610-30 and ISO 16610-31.

This document provides information on how to apply the robust estimation to the spline filter as specified in ISO 16610-22, as well as its generalized form for non-uniform sampling. The weight function chosen for the M-estimator is the Tukey biweight influence function as specified in ISO 16610-31.

Replaced standards (1)
XP ISO/TS 16610-32
XP ISO/TS 16610-32
August 2009
Standard Cancelled
Geometrical product specifications (GPS) - Filtration - Part 32 : robust profile filters : spline filters

ISO/TS 16610-32:2009 specifies the characteristics of robust spline filters for surface profiles. It specifies in particular how to separate the long and short wave content of a surface profile.

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