IEC 60060-3:1976
High-voltage test techniques - Part 3: Measuring devices
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
Applies to devices and complete systems, other than sphere-gaps, used for the measurement of voltages and currents during dielectric tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with high-impulse currents. Voltage measurements with sphere-gaps are dealt with in IEC 52. Gives guidance concerning the quantities to be measured, accuracies required and requirements of measuring systems.
Is applicable to complete Measuring Systems, and to their components, used for the measurement of high-voltages and currents during tests with direct voltage, alternating voltage, lightning and switching impulse voltages and for tests with impulse currents, or with combinations ot them as specified in IEC 60-1. Replaces IEC 60-3 and 60-4.
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