IEC 60068-2-29:1968/AMD1:1982
IEC 60068-2-29:1968/AMD1:1982

IEC 60068-2-29:1968/AMD1:1982

December 1982
International standard Cancelled

amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump

Main informations

Collections

International IEC standards

Publication date

December 1982

Number of pages

7 p.

Reference

IEC 60068-2-29:1968/AMD1:1982

Print number

1
Standard replaced by (1)
IEC 60068-2-29:1987
IEC 60068-2-29:1987
March 1987
International standard Cancelled
Environmental testing. Part 2: Tests. Test Eb and guidance: Bump

Determines the ability of a specimen to withstand specified severities of bump. Has the status of a basic safety publication in accordance with IEC Guide 104.

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