IEC 60384-1:2016
Fixed capacitors for use in electronic equipment - Part 1: Generic specification
IEC 60384-1:2016 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition contains the following significant technical changes with respect to the previous edition:- INTRODUCTION added;- 4.41 Whisker growth test added;- Annex Q completely restructured.
IEC 60384-1:2016 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition contains the following significant technical changes with respect to the previous edition:
- INTRODUCTION added;
- 4.41 Whisker growth test added;
- Annex Q completely restructured.
IEC 60384-1:2008 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition contains the following significant technical changes with respect to the previous edition: - implementation of Annex Q which replaces Clause 3.
IEC 60384-1:2021 is a generic specification and is applicable to fixed capacitors for use in electronic equipment. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition: a) The document has been completely restructured to comply with the ISO/IEC Directives, Part 2; a new technical categorization of test methods has been introduced and the test methods have been reorganized according to these new categories; tables, figures and references have been revised accordingly. b) Annex X has been added for comparison with the previous edition.
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