IEC 60427:1973

January 1973

International standard Cancelled

Report on synthetic testing of high-voltage alternating current circuit-breakers

Applies to a.c. circuit-breakers within the scope of IEC 56(Clause 1). It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test-duties described in Subclauses 6.102 to 6.111 of IEC 56, by synthetic methods. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.

Main informations

Collections

International IEC standards

Publication date

January 1973

Number of pages

86 p.

Reference

IEC 60427:1973

ICS Codes

29.130.10 High voltage switchgear and controlgear

Print number

Sumary

Report on synthetic testing of high-voltage alternating current circuit-breakers

Applies to a.c. circuit-breakers within the scope of IEC 56 (Clause 1). It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test-duties described in Subclauses 6.102 to 6.111 of IEC 56, by synthetic methods. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.

Standard replaced by (1)

IEC 60427:1989

December 1989

International standard Cancelled

Synthetic testing of high-voltage alternating current circuit-breakers

Applies to a.c. circuit-breakers within the scope of IEC 60056 (Clause 1). It provides the general rules for testing a.c. circuit-breakers, for making and breaking capacities over the range of test-duties described in Subclauses 6.102 to 6.111 of IEC 56, by synthetic methods. The purpose of this standard is to establish criteria for synthetic testing and for the proper evaluation of results. Such criteria will establish the validity of the test method without imposing restraints on innovation of test circuitry.

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