IEC 60512-25-6:2004

IEC 60512-25-6:2004

May 2004
International standard Current

Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Describes methods for measuring an eye pattern response and jitter in the time domain.

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Main informations

Collections

International IEC standards

Publication date

May 2004

Number of pages

35 p.

Reference

IEC 60512-25-6:2004
Sumary
Connectors for electronic equipment - Tests and measurements - Part 25-6: Test 25f: Eye pattern and jitter

Describes methods for measuring an eye pattern response and jitter in the time domain.
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