IEC 60512-28-100:2024 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC61076-1, IEC 61076-2, IEC 61076-3 and IEC 63171 series of standards for connecting hardware applications from 0,1 MHz up to 2 000 MHz, with reference to this document.Note: This document is also suitable for testing signal integrity and transmission performance of connectors up to a lower value of maximum frequency; however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector.The list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards.Test procedures provided herein are:- insertion loss, test 28a;- return loss, test 28b;- near-end crosstalk (NEXT) test 28c;- far-end crosstalk (FEXT), test 28d;- transverse conversion loss (TCL), test 28f;- transverse conversion transfer loss (TCTL), test 28g.Other test procedures referenced herein are:- shield transfer impedance (ZT), see IEC 60512‑26‑100, test 26e.- coupling attenuation (aC), see IEC 62153-4-7 and IEC 62153‑4‑12.- low frequency coupling attenuation (aCLF) see IEC 62153-4-7 and IEC 62153-4-15This edition includes the following significant technical changes with respect to the previous edition:-The frequency range has been modified to start at 0,1 MHz instead of 1 MHz, to include single-pair connectors.-All tables and requirements have been revised down to 0,1 MHz, and partially improved to reduce the impact of the test fixture.-Formulae to calculate the S-parameters from single-ended parameters have been added.-A note was added for those parameters which are not applicable to single-pair connectors.
IEC 60512-28-100:2019 specifies the test methods for signal integrity and transmission performance for connectors specified in respective parts of IEC 60603-7, IEC 61076-1, IEC 61076-2, and IEC 61076-3 standards for connecting hardware applications up to 2 000 MHz. It is also suitable for testing lower frequency connectors, however, the test methodology specified in the detail specification for any given connector remains the reference conformance test for that connector. The above list of connector series of standards does not preclude referencing this document in other connector manufacturer’s specifications or published standards. Test procedures provided herein are: - insertion loss, test 28a; - return loss, test 28b; - near-end crosstalk (NEXT) test 28c; - far-end crosstalk (FEXT), test 28d; - transverse conversion loss (TCL), test 28f; - transverse conversion transfer loss (TCTL), test 28g. Other test procedures referenced herein are: - transfer impedance (ZT), see IEC 60512-26-100, test 26e. - for coupling attenuation (aC), see IEC 62153 4 12. This second edition cancels and replaces the first edition, issued in 2013, and constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: - The title is revised from 1 000 MHz to 2 000 MHz to reflect the range of frequencies which may be tested. - All tables and requirements have been revised up to 2 000 MHz. Key words: Connectors, Signal Integrity Tests
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