IEC 60539-1:2016

IEC 60539-1:2016

April 2016
International standard Cancelled

Directly heated negative temperature coefficient thermistors - Part 1: Generic specification

IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.The contents of the corrigendum of September 2017 have been included in this copy.

Main informations

Collections

International IEC standards

Publication date

April 2016

Number of pages

115 p.

Reference

IEC 60539-1:2016
Sumary
Directly heated negative temperature coefficient thermistors - Part 1: Generic specification

IEC 60539-1:2016 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. IEC 60539 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This third edition cancels and replaces the second edition published in 2008. This edition constitutes a technical revision. Tables, figures and references have been revised.
The contents of the corrigendum of September 2017 have been included in this copy.
Replaced standards (1)
IEC 60539-1:2008
February 2008
International standard Cancelled
Directly heated negative temperature coefficient thermistors - Part 1: Generic specification

IEC 60539-1:2008 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose.

Standard replaced by (1)
IEC 60539-1:2022
December 2022
International standard Current
Directly heated negative temperature coefficient thermistors - Part 1: Generic specification

IEC 60539-1:2022 is applicable to directly heated negative temperature coefficient thermistors, typically made from transition metal oxide materials with semiconducting properties. It establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications of electronic components for quality assessment or any other purpose. This edition includes the following significant technical changes with respect to the previous edition: Restructured completely to comply to ISO/IEC directives; categorization and reorganization of test methods into these categories; Annex X added for comparison to the previous edition; Some wordings, figures and references have been revised.

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