IEC 60747-10:1984
IEC 60747-10:1984

IEC 60747-10:1984

January 1984
International standard Cancelled

Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

Main informations

Collections

International IEC standards

Publication date

January 1984

Number of pages

50 p.

Reference

IEC 60747-10:1984

Print number

1
Standard replaced by (1)
IEC 60747-10:1991
IEC 60747-10:1991
May 1991
International standard Cancelled
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits

It is a generic specification for semiconductor devices, discrete devices and integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. It defines general procedures for quality assessment to be used in the IECQ System and gives general rules for measuring methods of electrical characteristics, climatic and mechanical tests, and endurance tests.

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