IEC 60747-15:2010
Collections
International IEC standards
Publication date
December 2010
Number of pages
49 p.
Reference
IEC 60747-15:2010
IEC 60747-15:2010
December 2010
International standard
Cancelled
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below.a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses.b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion.c) Clause 8 was amended by suitable addition and deletion.d) Annex C, D and Bibliography were deleted.This publication is to be read in conjunction with IEC 60747-1:2006.
Main informations
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Sumary
Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below.
a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses.
b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion.
c) Clause 8 was amended by suitable addition and deletion.
d) Annex C, D and Bibliography were deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.
IEC 60747-15:2010 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices. The main changes with respect to previous edition are listed below.
a) Clause 3, 4 and 5 were re-edited and some of them were combined to other sub clauses.
b) Clause 6, 7 were re-edited as a part of "Measuring methods" with amendment of suitable addition and deletion.
c) Clause 8 was amended by suitable addition and deletion.
d) Annex C, D and Bibliography were deleted.
This publication is to be read in conjunction with IEC 60747-1:2006.
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Replaced standards
(1)
IEC 60747-15:2003
June 2003
International standard
Cancelled
Discrete semiconductor devices - Part 15: Isolated power semiconductor devices
IEC 60747-15:2003 gives the product specific standards, requirements and test methods for isolated power semiconductor devices. These requirements are added to those given in other parts of IEC 60747, IEC 60748 and IEC 60749 for the corresponding non-isolated power devices.
Standard replaced by
(1)
IEC 60747-15:2024
October 2024
International standard
Current
Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
IEC 60747-15:2024 gives the requirements for isolated power semiconductor devices. These requirements are additional to those given in other parts of IEC 60747 for the corresponding non-isolated power devices and parts of IEC 60748 for ICs. This third edition includes the following significant technical changes with respect to the previous edition: a) The intelligent power semiconductor modules (IPM), which was previously excluded from the first and second edition, is now included in this document (Annex C); b) The thermal resistance is described for each switch (6.2.4); c) Added isolation test between temperature sensor and terminals, in case there is an agreement with the user (6.1.2).
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