IEC 60747-2:2025
Collections
International IEC standards
Publication date
September 2025
Number of pages
50 p.
Reference
IEC 60747-2:2025
IEC 60747-2:2025
September 2025
International standard
Current
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
IEC 60747-2:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:- generic rectifier diodes;- avalanche rectifier diodes;- fast-switching rectifier diodes;- Schottky barrier diodes.If no ambiguity is likely to result, any of the above will be referred to as diodes.This edition includes the following significant technical changes with respect to the previous edition:a) the terms and definitions for partial thermal resistance junction-to-case have been added;b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.
Main informations
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Sumary
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
IEC 60747-2:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:
- generic rectifier diodes;
- avalanche rectifier diodes;
- fast-switching rectifier diodes;
- Schottky barrier diodes.
If no ambiguity is likely to result, any of the above will be referred to as diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) the terms and definitions for partial thermal resistance junction-to-case have been added;
b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.
IEC 60747-2:2025 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics (properties), measuring and test methods, requirements for type tests, routine tests, endurance tests and marking for the following discrete semiconductor devices:
- generic rectifier diodes;
- avalanche rectifier diodes;
- fast-switching rectifier diodes;
- Schottky barrier diodes.
If no ambiguity is likely to result, any of the above will be referred to as diodes.
This edition includes the following significant technical changes with respect to the previous edition:
a) the terms and definitions for partial thermal resistance junction-to-case have been added;
b) Clauses 3, 4, 5, 6 and 7 have been amended with some deletions of information no longer in use and with some necessary additions.
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Replaced standards
(1)
IEC 60747-2:2016
April 2016
International standard
Cancelled
Semiconductor devices - Part 2: Discrete devices - Rectifier diodes
IEC 60747-2:2016 provides standards for the following categories or sub-categories of rectifier diodes, including: - line rectifier diodes; - avalanche rectifier diodes; - fast-switching rectifier diodes; - Schottky barrier diodes. This edition includes the following significant technical changes with respect to the previous edition: a) Schottky barrier diodes and its properties are added; b) Clauses 3, 4, 5 and 7 were amended with some deletions of information no longer in use or already included in other parts of the IEC 60747 series, and with some necessary additions; c) Clause 6 was moved and added to Clause 7 of this third edition; d) some parts of Clause 7 were moved and added to Clause 7 of this third edition; e) Annex A was deleted. This publication is to be read in conjunction with IEC 60747-1:2006.
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