IEC 60747-5-3:1997

IEC 60747-5-3:1997

September 1997
International standard Cancelled

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

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Main informations

Collections

International IEC standards

Publication date

September 1997

Number of pages

61 p.

Reference

IEC 60747-5-3:1997

ICS Codes

31.260   Optoelectronics. Laser equipment

Print number

1
Sumary
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
Replaced standards (3)
IEC 60747-5:1992
April 1992
International standard Cancelled
Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

Provides terminology, letter symbols, essential ratings and characteristics as well as measuring methods for semiconductor photo-emitters, photo-electric detectors, photo-sensitive devices and semiconductor devices utilizing optical radiation for internal operation.

IEC 60747-5:1992/AMD1:1994
November 1994
International standard Cancelled
Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

IEC 60747-5:1992/AMD2:1995
April 1995
International standard Cancelled
Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices

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