IEC 60747-5-3:1997

IEC 60747-5-3:1997

September 1997
International standard Cancelled

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

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Main informations

Collections

International IEC standards

Publication date

September 1997

Number of pages

61 p.

Reference

IEC 60747-5-3:1997

Print number

1
Sumary
Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
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