IEC 60747-5-5:2007/AMD1:2013
IEC 60747-5-5:2007/AMD1:2013

IEC 60747-5-5:2007/AMD1:2013

May 2013
International standard Cancelled

Amendment 1 - Semiconductor devices - Discrete devices - Part 5-5: Optoelectronic devices - Photocouplers

Main informations

Collections

International IEC standards

Publication date

May 2013

Number of pages

8 p.

Reference

IEC 60747-5-5:2007/AMD1:2013
Standard replaced by (1)
IEC 60747-5-5:2020
IEC 60747-5-5:2020
July 2020
International standard Current
Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

IEC 60747-5-5:2020 specifies the terminology, essential ratings, characteristics, safety tests, as well as the measuring methods for photocouplers. Note: The term "optocoupler" can also be used instead of "photocoupler". This edition includes the following significant technical changes with respect to the previous edition: a) optional data sheet basic insulation rating in accordance with IEC 60664-1:2007, 6.1.3.5; b) editorial corrections on the use of VIORM; c) editorial corrections on Figure 2: Time intervals for method b); d) addition of an alternative surge pulse VIOSM test method.

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