IEC 60747-8:1984

December 1984

International standard Cancelled

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

Gives standards for the following categories of field-effect transistors : -Type A: junction-gate type; -Type B: insulated-gate depletion type; -Type C: insulated-gate enhancement type.

Main informations

Collections

International IEC standards

Publication date

December 1984

Number of pages

91 p.

Reference

IEC 60747-8:1984

ICS Codes

31.080.30 Transistors

Print number

Sumary

Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

Gives standards for the following categories of field-effect transistors : -Type A: junction-gate type; -Type B: insulated-gate depletion type; -Type C: insulated-gate enhancement type.

Replaced standards (1)

IEC 60147-2G:1975

January 1975

International standard Cancelled

Supplement G - Essential ratings and characteristics of semiconductor devices and general principles of measuring methods - Part 2: General principles of measuring methods - Chapter 4: Field-effect transistors

Standard replaced by (1)

IEC 60747-8:2000

December 2000

International standard Cancelled

S emiconductor devices - Part 8: Field-effect transistors

Gives standards for the following categories of field-effect transistors : -Type A: junction-gate type; -Type B: insulated-gate depletion type; -Type C: insulated-gate enhancement type.

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