IEC 60748-11-1:1992

IEC 60748-11-1:1992

April 1992
International standard Current

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.

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Main informations

Collections

International IEC standards

Publication date

April 1992

Number of pages

71 p.

Reference

IEC 60748-11-1:1992

Print number

1 - 12/02/2007
Sumary
Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

The purpose of these tests is to check the internal materials, construction and workmanship of integrated circuits for compliance with the requirements of the applicable specification.
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