IEC 60748-4-3:2006

IEC 60748-4-3:2006

August 2006
International standard Current

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics

See more
Main informations

Collections

International IEC standards

Publication date

August 2006

Number of pages

36 p.

Reference

IEC 60748-4-3:2006

Print number

1 - 04/10/2006
Sumary
Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

Specifies a set of measuring methods and requirements for testing ADCs under dynamic conditions, together with associated terminology and characteristics
Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo

I discover COBAZ