IEC 60749-1:2002

IEC 60749-1:2002

August 2002
International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 1 : general

Main informations

Collections

International IEC standards

Publication date

August 2002

Number of pages

15 p.

Reference

IEC 60749-1:2002

ICS Codes

31.080.01   Semiconductor devices in general

Print number

1 - 13/06/2005
Need to identify, monitor and decipher standards?

COBAZ is the simple and effective solution to meet the normative needs related to your activity, in France and abroad.

Available by subscription, CObaz is THE modular solution to compose according to your needs today and tomorrow. Quickly discover CObaz!

Request your free, no-obligation live demo

I discover COBAZ