IEC 60749-1:2002
Collections
International IEC standards
Publication date
August 2002
Number of pages
15 p.
Reference
IEC 60749-1:2002
IEC 60749-1:2002
August 2002
International standard
Current
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
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Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 1: General
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
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Voir moins
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