IEC 60749-13:2002

April 2002

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Main informations

Collections

International IEC standards

Publication date

April 2002

Number of pages

9 p.

Reference

IEC 60749-13:2002

Print number

1 - 13/06/2005

Sumary

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Standard replaced by (1)

IEC 60749-13:2018

February 2018

International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

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