IEC 60749-20:2020

August 2020

International standard Current

Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

Main informations

Collections

International IEC standards

Publication date

August 2020

Number of pages

55 p.

Reference

IEC 60749-20:2020

ICS Codes

31.080.01 Semiconductor devices in general

Print number

Replaced standards (1)

IEC 60749-20:2008

December 2008

International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 20 : resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

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