IEC 60749-2:2002
Collections
International IEC standards
Publication date
April 2002
Number of pages
11 p.
Reference
IEC 60749-2:2002
IEC 60749-2:2002
April 2002
International standard
Current
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V.This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only.The contents of the corrigendum of August 2003 have been included in this copy.
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Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.
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