IEC 60749-22:2002

IEC 60749-22:2002

September 2002
International standard Cancelled

Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements. The contents of the corrigendum of August 2003 have been included in this copy.

Main informations

Collections

International IEC standards

Publication date

September 2002

Number of pages

41 p.

Reference

IEC 60749-22:2002
Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 22: Bond strength

Applicable to semiconductor devices (discrete devices and integrated circuits), this test measures bond strength or determine compliance with specified bond strength requirements. The contents of the corrigendum of August 2003 have been included in this copy.
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