IEC 60749-31:2002
Collections
International IEC standards
Publication date
August 2002
Number of pages
9 p.
Reference
IEC 60749-31:2002
IEC 60749-31:2002
August 2002
International standard
Current
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.
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Sumary
Semiconductor devices - Mechanical and climatic test methods - Part 31: Flammability of plastic-encapsulated devices (internally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.
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