IEC 60759:1983

January 1983

International standard Current

Standard test procedures for semiconductor X-ray energy spectrometers

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

Main informations

Collections

International IEC standards

Publication date

January 1983

Number of pages

97 p.

Reference

IEC 60759:1983

ICS Codes

17.240 Radiation measurements

Print number

1 - juin 2005

Sumary

Standard test procedures for semiconductor X-ray energy spectrometers

Gives standard test procedures for semiconductor X-ray energy spectrometers consisting of a semiconductor radiation detector assembly and signal processing electronics interfaced to a pulse-height analyzer/computer.

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