IEC 61000-3-3:1994
Electromagnetic compatibility (EMC) - Part 3: Limits - Section 3: Limitation of voltage fluctuations and flicker in low-voltage supply systems for equipment with rated current <= 16 A
This section of IEC 61000-3 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This section is applicable to electrical and electronic equipment having an input current up to and including 16 A per phase and intended to be connected to public low-voltage distribution systems of between 220 V and 250 V at 50 Hz line to neutral. This publication supersedes IEC 60555-3.
This section of IEC 61000-3 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This section is applicable to electrical and electronic equipment having an input current up to and including 16 A per phase and intended to be connected to public low-voltage distribution systems of between 220 V and 250 V at 50 Hz line to neutral. This publication supersedes IEC 60555-3.
IEC 61000-3-3:2008 is concerned with the limitation of voltage fluctuations and flicker impressed on the public low-voltage system. It specifies limits of voltage changes which may be produced by an equipment tested under specified conditions and gives guidance on methods of assessment. This part of IEC 61000 is applicable to electrical and electronic equipment having an input current equal to or less than 16 A per phase, intended to be connected to public low-voltage distribution systems of between 220 V and 250 V line to neutral at 50 Hz, and not subject to conditional connection. The tests according to this part are type tests. Particular test conditions are given in annex A and the test circuit is shown in Figure 1. This second edition IEC 61000-3-3 cancels and replaces the first edition published in 1994, amendment 1 (2001) and amendment 2 (2005). This edition constitutes a revised edition.
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