IEC 61000-4-11:2020
Collections
International IEC standards
Publication date
January 2020
Number of pages
62 p.
Reference
IEC 61000-4-11:2020
IEC 61000-4-11:2020
January 2020
International standard
Current
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon.NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:- rise time and fall time of transients are now defined terms in Clause 3;- the origin of voltage dips and short interruptions is now stated in Clause 4.The contents of the corrigendum of May 2020 and October 2022 have been included in this copy.
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Sumary
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase
IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon.
NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- rise time and fall time of transients are now defined terms in Clause 3;
- the origin of voltage dips and short interruptions is now stated in Clause 4.
The contents of the corrigendum of May 2020 and October 2022 have been included in this copy.
IEC 61000-4-11:2020 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This document applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz AC networks. It does not apply to electrical and electronic equipment for connection to 400 Hz AC networks. Tests for these networks will be covered by future IEC documents. The object of this document is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations.
NOTE 1 Voltage fluctuation immunity tests are covered by IEC 61000-4-14. The test method documented in this document describes a consistent method to assess the immunity of equipment or a system against a defined phenomenon.
NOTE 2 As described in IEC Guide 107, this is a basic EMC publication for use by product committees of the IEC. As also stated in Guide 107, the IEC product committees are responsible for determining whether this immunity test standard should be applied or not, and, if applied, they are responsible for defining the appropriate test levels. Technical committee 77 and its sub-committees are prepared to co-operate with product committees in the evaluation of the value of particular immunity tests for their products. This third edition cancels and replaces the second edition published in 2004 and Amendment 1:2017. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
- rise time and fall time of transients are now defined terms in Clause 3;
- the origin of voltage dips and short interruptions is now stated in Clause 4.
The contents of the corrigendum of May 2020 and October 2022 have been included in this copy.
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Replaced standards
(2)
IEC 61000-4-11:2004/AMD1:2017
May 2017
International standard
Cancelled
Amendment 1 - Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
IEC 61000-4-11:2004
March 2004
International standard
Cancelled
Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests
This part of IEC 61000 defines the immunity test methods and range of preferred test levels for electrical and electronic equipment connected to low-voltage power supply networks for voltage dips, short interruptions, and voltage variations. This standard applies to electrical and electronic equipment having a rated input current not exceeding 16 A per phase, for connection to 50 Hz or 60 Hz a.c. networks. It does not apply to electrical and electronic equipment for connection to 400 Hz a.c. networks. Tests for these networks will be covered by future IEC standards. The object of this standard is to establish a common reference for evaluating the immunity of electrical and electronic equipment when subjected to voltage dips, short interruptions and voltage variations. This second edition cancels and replaces the first edition published in 1994 and its amendment 1 (2000). This second edition constitutes a technical revision in which 1) preferred test values and durations have been added for the different environment classes; 2) the tests for the three-phase systems have been specified. It has the status of a Basic EMC Publication in accordance with IEC Guide 107. The contents of the interpretation sheet 1 of August 2010 have been included in this copy.
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