IEC 61000-4-29:2000
Collections
International IEC standards
Publication date
August 2000
Number of pages
37 p.
Reference
IEC 61000-4-29:2000
IEC 61000-4-29:2000
August 2000
International standard
Current
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
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Sumary
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
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